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Quantum Metrology with a Scanning Probe Atom Interferometer

Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, Vol. 111, H. 14 , 143001.

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Official URL: http://edoc.unibas.ch/dok/A6212035

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Experimentelle Nanophysik (Treutlein)
UniBasel Contributors:Treutlein, Philipp and Schmied, Roman and Ockeloen, Caspar Frederik and Riedel, Max
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:American Physical Society
ISSN:0031-9007
Note:Publication type according to Uni Basel Research Database: Journal article
Last Modified:31 Jan 2014 09:51
Deposited On:31 Jan 2014 09:51

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