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Quantum Metrology with a Scanning Probe Atom Interferometer

Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, 111 (14). p. 143001.

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Official URL: http://edoc.unibas.ch/dok/A6212035

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Abstract

We use a small atomic Bose-Einstein condensate as an interferometric scanning probe to map out a microwave field near a chip surface with a few micrometers resolution. Using entanglement between the atoms we overcome the standard quantum limit of interferometry by 4 dB and maintain enhanced performance for interrogation times up to 20 ms. This demonstrates the usefulness of quantum metrology with entangled states when the particle number is limited due to the small probe size. Extending atom interferometry to micrometer spatial resolution enables new applications in electromagnetic field sensing, surface science, and the search for fundamental short-range interactions.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Experimentelle Nanophysik (Treutlein)
UniBasel Contributors:Treutlein, Philipp and Schmied, Roman and Ockeloen, Caspar Frederik and Riedel, Max
Item Type:Article, refereed
Article Subtype:Research Article
Bibsysno:Link to catalogue
Publisher:American Physical Society
ISSN:0031-9007
Note:Publication type according to Uni Basel Research Database: Journal article
Language:English
Identification Number:
Last Modified:05 Apr 2018 12:20
Deposited On:31 Jan 2014 09:51

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