Sadeghi, Ali and Baratoff, Alexis and Ghasemi, S. Alireza and Goedecker, Stefan and Glatzel, Thilo and Kawai, Shigeki and Meyer, Ernst. (2012) Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution. Physical Review B, Vol. 86, H. 7 , 075407.
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Official URL: http://edoc.unibas.ch/dok/A6083414
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) 05 Faculty of Science > Departement Physik > Physik > Physik (Goedecker) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst and Goedecker, Stefan |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Institute of Physics |
| ISSN: | 0163-1829 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: | |
| Last Modified: | 17 Apr 2020 03:10 |
| Deposited On: | 24 May 2013 09:02 |
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