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Atomic force microscopy : a tool for surface science

Frommer, J. and Meyer, E.. (1991) Atomic force microscopy : a tool for surface science. Journal of physics. Condensed matter, Vol. 3, Suppl. A , S1-S9.

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Official URL: http://edoc.unibas.ch/dok/A5839526

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Abstract

The understanding and manipulation of surfaces have been greatly helped by a variety of atomic force microscopes.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:Institute of Physics Publishing
ISSN:0953-8984
Note:Publication type according to Uni Basel Research Database: Journal article
Identification Number:
Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:45

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