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A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry

Wetzel, A. and Socoliuc, A. and Meyer, E. and Bennewitz, R. and Gnecco, E. and Gerber, C.. (2005) A versatile instrument for in situ combination of scanning probe microscopy and time-of-flight mass spectrometry. Review of scientific instruments, Vol. 76, H. 10 , 103701, 6 S..

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Official URL: http://edoc.unibas.ch/dok/A5262117

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Abstract

A scanning probe microscope is combined with a time-of-flight mass spectrometer that analyzes material from the tip of the probe microscope. Chemical analysis on the nanometer scale is achieved by transferring material from surfaces via the probing tip to the mass spectrometer under ultrahigh vacuum conditions. Fast switching between scanning probe and mass analysis operation is implemented by means of a motorized rotatable probe holder. Electrochemically etched tungsten tips are used as probes for the experiments. Thorough characterization of the tips by means of field-emission measurements is crucial for successful experiments. Quartz tuning forks have been applied as force sensors in force microscopy experiments.
Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer)
UniBasel Contributors:Meyer, Ernst
Item Type:Article, refereed
Bibsysno:Link to catalogue
Publisher:American Institute of Physics
ISSN:0034-6748
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:22 Mar 2012 14:27
Deposited On:22 Mar 2012 13:55

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